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Transmission Electron Microscopy: A Textbook for Materials Science 精装

英语版本

4.0 46 评论

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语言

英语
尺寸

21.34 x 4.32 x 28.45 cm
ISBN-10

038776500X
ISBN-13

978-0387765006
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语言 ‏ : ‎ 英语
ISBN ‏ : ‎ 038776500X
尺寸 ‏ : ‎ 21.34 x 4.32 x 28.45 cm

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4.0 46 评论

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美国亚马逊： 38 条评论

Tanis Coralee Leonhardi

Great volumes for learning the basics and referring back to during research

2020年1月5日 - 已在美国亚马逊上发表

已确认购买

I paired this with sitting in on a class on Electron Microscopy and doing research using these methods. Reading will only get you so far in understanding, and so will research. Pairing discussion, reading, and hands-on work is most effective for feeling confident while using expensive equipment that is easily damageable and accurately processing and interpreting collected data. These volumes provide good base knowledge and visuals to build upon through other types of learning. The methods I was using, Scanning Electron Microscopy and X-ray Laue microdiffraction, were not both covered in depth, though what was included was still useful information. These are the books I found myself referring back to the most on my work measuring residual strains in natural materials.

got2ske

Great practical balance between Theory and How-To

2011年3月28日 - 已在美国亚马逊上发表

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As a graduate student who is currently taking a lab course and being trained in the art and science of TEM, I find this to be an excellent resource. Reading "Part 1 - Basics" as I became familiar with the instrument, and then moving on to the other more detailed sections as needed (Part II = Diffraction, Part III = Imaging, and Part IV = Analytical TEM) has helped immensely in understanding what I'm doing when working at the microscope.

I used Fultz & Howe, 3rd. edition for a TEM-theory class last semester; while it is also an excellent book (more rigorous in terms of theoretical basis and derivations), I find that Williams & Carter is a better place to start in getting acquainted with the many aspects of TEM. The large, color diagrams in the 2nd edition are also very helpful, and this is another aspect that distinguishes it from Fultz & Howe.

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Anton Gregoff

Must have book

2011年10月4日 - 已在美国亚马逊上发表

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The item includes 4 volumes for a total of ~800 pages. It gives the basic knowledges on TEM, spectrometry, diffraction, imaging, and also on the instrument itself. However the chapter are not going too much in details about the physics, but addresses clearly what is important to keep in mind when using a TEM. Therefore it is a must have book for any user.
I recommend to complete with other books like those from RF Egerton, especially for any EELS related topic that includes the thickness measurement of a sample. Other works from I. Pozsgai may also help in simplifying the mass-thickness method.

S. Mcmurray

Great TEM book

2010年12月5日 - 已在美国亚马逊上发表

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This is one of the best text books I've ever used. It's very readable, & does a good job of presenting difficult material. I love the references at the beginning of each book detailing what different acronyms mean, and what different variables may stand for. They also have good 'how-to' sections of the book for specific processes in the TEM, like how to make an SADP, and so on. They really wrote this with the student in mind.

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